Workshop on Electron Microscopy

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Workshop on Electron Microscopy

May 4th 2018, at INL’s Auditorium


The recognition that TEM/STEM and SEM coupled with EELS, EDS and in situ holders can be used as a powerful tool for characterization of materials has been widely established. Recently, the study and development of nanomaterials, a field which is quickly becoming one of the most promising fields of science and technology today, and the development in electron optics, detectors, stage design and fabrication, and recording media has brought an exciting resurgence of interest in TEM. The goal of this symposium is to bring together a wide variety of researchers with interests in the science, engineering and technological applications to discuss the use of TEM/STEM and SEM techniques on the characterization and modification of properties of materials. Abstracts are solicited in, but not limited to, the following areas involving the use of TEM/STEM and SEM.

TOPICS | Workshop on Electron Microscopy

  • Fundamental properties of materials

  • Nanoparticles

  • Biological materials

  • Organic/Inorganic interfaces

  • Solid/Liquid Interfaces

  • 2-D materials

  • Energy Materials

  • Structure of Materials

  • Chemical reactions and catalysis


PROGRAM – Workshop on Electron Microscopy

09:30 – 10:00 Registration at INL
10:00 – 10:15 “Welcome and Introduction to the Workshop” Paulo Ferreira, Head of Department of Advanced Electron Microscopy, Imaging and Spectroscopy, INL; Professor, IST, University of Lisbon; Professor, University of Texas at Austin, USA
10:15 – 11:00 “Imaging and Spectroscopy of Functional Oxide Nanowires” Velimir R. Radmilović, Professor, University of Belgrade, Serbia; Principal Research Fellow, Berkeley National Laboratory, USA
11:00 – 11:15 Coffee break / Poster session (sponsorised by Monocomp)
11:15 – 12:00 “Atomic structure/configuration and physical properties studies of hybrid nanostructures by STEM-EELS” Raúl Arenal, ARAID Researcher, The Institute of Nanoscience of Aragon (INA), Spain.
12:00 – 14:00 Lunch
13:30 – 14:00 Tour by Electron Microscopy Facilities
14:00 – 14:45 “Defect phenomena in nanostructures: An ultrahigh resolution aberration-corrected electron microscopy study” Nasim Alem, Assistant Professor, Dept. of Materials Science and Engineering, Penn State University, USA
14:45 – 15:30 “Electron crystallography in TEM: from archaeology to amorphous pharmaceuticals” Stavros Nicolopoulos, NanoMEGAS SPRL Brussels, Belgium
15:30 – 17:00 Coffee break / Poster session
17:00 – 17:15 Poster Contest: Prize Ceremony (Sponsorised by IZASA)
17:15 Closing remarks

Read the booklet of the workshop here, or download it!


Dear Attendee,

We want to thank for participating in this unique workshop!

We hope that you enjoyed the sessions and the opportunity to get involved in the discussion of the use of TEM/STEM and SEM techniques on the characterization and modification of properties of materials.

Electron Microscopy Workshop team

Gold Sponsors:

Silver Sponsors:


Dr. Raúl Arenal

ARAID Researcher at The Institute of Nanoscience of Aragon (INA), Spain.

Dr. Raul Arenal received his Ph.D. in Solid State Physics from Univ. Paris-Sud (Orsay, France, 2005) and in 2013, he obtained his Habilitation (HDR) also at this University. From April 2005 to August 2007, he joined the Electron Microscopy Center in Argonne National Laboratory (ANL, USA) as post doctoral fellow. In 2007, he became research scientist (Chargé de Recherches) at the CNRS (France), working at the LEM, CNRS-ONERA (Chatillon, France). From September 2010 to December 2011, he was visiting scientist (sabbatical position) at the Laboratorio de Microscopias Avanzadas (LMA) at the Instituto de Nanociencia de Aragon (INA) of the Universidad de Zaragoza (Spain). Since 2012, Dr. Arenal is on leave from the CNRS, and he is currently ARAID research scientist at the LMA-INA-Universidad de Zaragoza. In addition, since 2007 he is visiting researcher at the ANL (USA). He has published more than 145 papers (H=28 ISI, H=33 Google Scholar) in refereed journals, edited 1 book and published 6 chapters of a book. In 2017, Dr. Arenal has been elected member of the Young Academy of Europe (YAE) and also from this year he has been elected at the board of the YAE. His broad area of research interest lies in electron microscopy focused on materials science and nanoscience: TEM (EELS, HR(S)TEM, electron diffraction, electron tomography). These studies are mainly focused on the growth mechanism, structural and physical (electronic, optical, vibrational, mechanical) properties of nanomaterials based on carbon, boron and nitrogen as well as other nano-structures (in particular, metallic nano-objects for plasmonic/photonic interest). Among his scientific activities, Dr. Arenal is the chair of the HeteroNanoCarb conference series ( focused on graphene, NT and related 1D-2D nanomaterials.

Dr. Nasim Alem

Assistant Professor, Dept. of Materials Science and Engineering, Penn State University, USA

Nasim Alem is an assistant professor in the Materials Science and Engineering department at the Penn State University. Nasim received her B.S. degree in Metallurgical Engineering from Sharif University of Technology, Tehran, Iran and her M.S. degree in Materials Science and Engineering from Worcester Polytechnic Institute. She received her PhD from the Materials Science Department at Northwestern University. Nasim has been a postdoctoral researcher in the Physics Department at University of California Berkeley and National Center for Electron Microscopy (NCEM) at Lawrence Berkeley National Lab, before joining Penn State in 2013. Her awards include NSF CAREER award, Wilson research grant, and NCEM young investigator fellowship. Alem group research is focused on probing the atomic and chemical structure of the defects, edges, grain boundaries and interfaces and their stability and transition dynamics using scanning/transmission electron microscopy imaging and spectroscopy.

More information here

Defects and interfaces can have a profound effect on the macroscale physical and chemical properties of nanostructures through modifying their local atomic and electronic structure.  While defects and interfaces have been a well-studied subject for decades, we know little about their local atomic and chemical structure, sub-Angstrom structural distortions within their vicinity, and their stability and transition dynamics under extreme conditions.  The past decade has seen incredible progress in the ability to image and manipulate the atomic and chemical structure of nanomaterials with the development of aberration-corrected scanning/transmission electron microscopy (S/TEM).  Using ultra-high resolution aberration-corrected S/TEM imaging and spectroscopy, this presentation will focus on our recent efforts on probing the atomic and chemical structure of nanomaterials and the sub-Angstrom structural distortions and relaxation effects that occurs around the defects, dopants, domain walls and interfaces in the family of 2D crystals and complex oxides.

In the family of 2D crystal transition metal dichalcogenides (TMDs) alloys, we show the formation of chemically ordered states and vacancy/dopant coupling that leads to unusual relaxation effects around dopant-vacancy complexes.  In addition, we explore stability and transition dynamics of defects leading to grain boundary migration in monolayer TMDs under electron beam irradiation.  In the family of complex oxides, structural distortions at domain walls and interfaces can directly tune their resulting macroscale physical and electronic properties leading to multiferroics, photovoltaic behavior, and two dimensional electron gas.  Using high resolution STEM imaging, this presentation will also focus on our recent efforts on the metrology of the polar displacements in a variety of complex oxide nanostructures such as LiNbO3, brownmillerite superlattices, as well as polar metals.

Prof. Velimir R. Radmilović

Professor, University of Belgrade, Serbia; Principal Research Fellow, Berkeley National Laboratory, USA

Velimir Radmilović was born in 1948 in Herceg Novi, Montenegro. He graduated from the Faculty of Technology and Metallurgy, University of Belgrade, in 1972. He got his MSc (1981) and PhD (1985) degree from the same faculty. Dr. Radmilovic got a position of an assistant professor in Physical Metallurgy from the Faculty of Technology and Metallurgy in Belgrade in 1985, associate professor in 1991, and full professor in 1995. He has been teaching numerous undergraduate and graduate courses related to materials science and physical metallurgy such as: physical metallurgy, phase transformations, crystallography and crystal defects, X-ray diffraction, electron microscopy, mechanical metallurgy, and heat treatment. He is the author or coauthor of more than 200 scientific papers published in peer review journals in the field of physical metallurgy, materials science, nanoscience and nanotechnology and numerous papers published in conference proceedings and presented at national and international conferences. His results were cited in the scientific literature more than 5000 times. As a visiting professor and a research fellow he worked at the Department of Materials Science, University of California at Berkeley, University of Pittsburgh, Pennsylvania, and National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, where he was a principal investigator until 2011. In 2012, he became a corresponding member of the Serbian Academy of Sciences and Arts.

He has been a reviewer for numerous peer review journals such as Metallurgical and Materials Transactions, Materials Science and Engineering, Science, Nanotechnology, Acta Materialia, Scripta Materialia, Diamond and Related Materials, Journal of Materials Science, Journal of Serbian Chemical Society, etc.

Thermoelectric M2O3(ZnO)n nanowires, where M could be In, Ga, Fe, are synthesized using facile solid state diffusion, enabled us to control their defect structure at atomic level. Two kind of defects, planar, parallel to basal wutzite planes, and zigzag, parallel to piramidal planes, facilitate decoupling of electrical and thermal properties. High angle annular dark field (HAADF) imaging of an IGZO nanowire reveled the presence of planar defects, which are monoatomic layers of indium perpendicular to the [002] direction, separated by wurtzite MZnnO(n+1)+  slabs of varying thicknesses. Every O atom on the edges of the MO2  octahedral layers is bonded to three In/Ga atoms and one metal atom within the MZnnO(n+1)+  layer. This creates an inversion domain boundary (IDB) in the wurtzite lattice since the Zn-O bonds on either side of the octahedral layer point with the O atoms toward the In/Ga layer. The MO2  inclusion layer is also associated with a stacking fault, and the wurtzite lattice on one side of the In/Ga layer is translated by ⅓<100>. In some nanowires, partial In/Ga inclusions were also observed. The ends of these partial inclusions are associated with edge dislocations with the dislocation line lying at the leading edge of the MO2 plane. In summary, M2O3(ZnO)n  polytypoid nanowires were converted from pure ZnO nanowires using a simple preferential diffusion process along line defects, which can be used to produce a wide range of ZnO alloys with controllable alloy concentration and layer density. The single layer inclusion growth originates from the surface and propagates though the nanowire by a defect-assisted process. From this study it is apparent that better control of nanometer-scale features could be the key in developing next-generation thermoelectric materials.

Dr. Stavros Nicolopoulos

President and co-founder NanoMEGAS SPRL Brussels, Belgium

Dr. Stavros Nicolopoulos (Athens, Greece 1961) graduated from the  Faculty of Physics (Univ of Thessaloniki, Greece) and got  his Msc (1985) and  PhD (1989)  in Materials  Science (X-Ray and neutron crystallography of magnetic structures)  from University of Grenoble (France).

He got a position as Associate  Professor at Complutense University  (Madrid, Spain) from 1991-96 dedicated in biomaterials research at  School of  Pharmacy. He has worked since 1996-2004 in Philips Electron Optics  as TEM application  specialist  and from 2001-2004 as President of FEI (ex-Philips Electron Optics)  in Spain.

Nowadays Dr. Stavros is President and co-Founder of NanoMEGAS SPRL company based in Brussels (2004-actually), the first company in TEM microscopy field that commercialized  innovative precession electron diffraction devices/applications worldwide.

Dr. Stavros Nicolopoulos is author (or co-author) of 68 international peer-reviewed journal publications (h=21 Google Scholar), 86 conference proceedings  and participated in 91 invited lectures. He was named  in 2004  “Consultant of International Union of Crystallography (IUCr) Comission on electron crystallography” and has participated/co-organized 50 International  electron crystallography workshops worldwide since 1998 -2017

Following his research dedication in electron crystallography, he was Guest Editor in “Ultramicroscopy” in a Special dedicated Issue (vol.107, June 2007 New Fronteers in Electron Crystallography”, Co-Editor in Materials Research Society Proc. Vol. 1184 (2009) Structural fingerprinting of nanocrystals and Guest  Editor in “Crystal  Research and Technology” (vol. 46 June 2011)  Special issue : New Developments in Electron Diffraction”.

In July 2011 he received together with  Dr. E.Rauch (CNRS Grenoble) the “Microscopy Today 2011 Innovation Award”  at the International  Microscopy and Microanalysis Congress Virginia, USA for the development of  ASTAR phase /orientation mapping system for diffraction analysis in TEM microscopes , as one of the 10 most  important  inventions in electron microscopy in 2011. He has also been reviewer in specialized  peer review microcopy joyrnals such as Ultramicroscopy.

Dr. Stavros is actually leading NanoMEGAS SPRL Company with 15 other scientists and technical collaborators.Precession electron devices in electron microscopes (TEM) first developed and commercialized  by NanoMEGAS  in 2004 were critical to allow solving nm size crystal structures by TEM precession diffraction ,rendering the technique as complementary to Synchrotron X-Ray powder diffraction applications.


Prof. Paulo Ferreira

Head of Department of Advanced Electron Microscopy, Imaging and Spectroscopy. International Iberian Nanotechnology Laboratory, Braga, Portugal

Professor, IST, University of Lisbon, Portugal

Professor, The University of Texas at Austin, USA

Dr. Leonard Francis

Group Leader

Dept. of Advanced Electron Microscopy, Imaging and Spectroscopy

INL – International Iberian Nanotechnology Laboratory – Braga

Dr. Enrique Carbó-Argibay

Electron Microscopy Facility Manager

Dept. of Advanced Electron Microscopy, Imaging and Spectroscopy

INL – International Iberian Nanotechnology Laboratory – Braga

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